DocumentCode :
682990
Title :
Combined optical and electrical analysis of efficiency enhancement in solar cells with embedded dielectric nanoparticles
Author :
Murthy, M.S. ; Bajaj, Mohit ; Sathaye, Ninad D. ; Murali, Kota V. R. M. ; Ganguly, Shaumik
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol., Bombay, Mumbai, India
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
1897
Lastpage :
1901
Abstract :
We study, by coupled electromagnetic and semiconductor device simulation, the effect of dielectric nanoparticles embedded in the depletion region of thin film solar cells. Absorbed photon densities, calculated using an electromagnetic solver, are mapped to the nodes of an electrical mesh on which three dimensional semiconductor device equations are solved. For the first time, we include here the effects of surface recombination and interface states at the Si/dielectric interface. We predict maximum increases of 9.3% and 9.9% in short circuit current density and efficiency respectively due to enhanced scattering from the dielectric nanoparticles.
Keywords :
dielectric materials; elemental semiconductors; interface states; nanoparticles; semiconductor device models; silicon; solar cells; surface recombination; Si; Si-dielectric interface; absorbed photon densities; coupled electromagnetic simulation; depletion region; efficiency enhancement; electrical analysis; electrical mesh; electromagnetic solver; embedded dielectric nanoparticles; interface states; optical analysis; semiconductor device simulation; short circuit current density; surface recombination; thin film solar cells; three dimensional semiconductor device equations; Dielectrics; Nanoparticles; Optical scattering; Photovoltaic cells; Plasmons; Silicon; Spontaneous emission; coupled simulation; dielectric nanoparticle; thin film solar cells;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6744514
Filename :
6744514
Link To Document :
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