• DocumentCode
    682991
  • Title

    Design of ultra-broadband antireflection coatings utilizing integrated moth-eye structures for multi-junction device applications

  • Author

    Perl, Emmett E. ; Chieh-Ting Lin ; McMahon, William E. ; Bowers, John E. ; Friedman, Daniel J.

  • Author_Institution
    Univ. of California at Santa Barbara, Santa Barbara, CA, USA
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Firstpage
    1902
  • Lastpage
    1906
  • Abstract
    Ultra-broadband Antireflection Coatings (ARCs) are essential to realizing the potential efficiency gains of four-junction photovoltaic devices that absorb to longer wavelengths than state-of-the-art three-junction cells. In this work, we examine a novel design that integrates a nanostructured antireflection layer with a multilayer ARC. Using optical models, we find that this hybrid approach can reduce the reflected AM1.5D power by 10-45 W/m2 compared to conventional thin-film ARCs. A hybrid ARC is designed and fabricated on a sample consisting of approximately 1μm of indium gallium phosphide (InGaP) on gallium arsenide (GaAs). For the hybrid coating, we measure a reflection loss of just 23.9 W/m2 corresponding to less than a 3% power reflection.
  • Keywords
    III-V semiconductors; antireflection coatings; gallium compounds; indium compounds; solar cells; GaAs; InGaP; four-junction photovoltaic devices; moth-eye structures; multijunction device; nanostructured antireflection layer; reflection loss; three-junction cells; ultrabroadband antireflection coatings; Coatings; Nonhomogeneous media; Optical reflection; Optical refraction; Reflectivity; III-V semiconductor materials; biomimetics; nanophotonics; optical films; photovoltaic cells; solar energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/PVSC.2013.6744515
  • Filename
    6744515