• DocumentCode
    683108
  • Title

    Calyxo´s advanced CdTe module designed for hot climates

  • Author

    Bauer, Matthias ; Frenck, Jochen ; Fritsche, Jochen ; Becker, Frank ; Kormanyos, Kenneth R.

  • Author_Institution
    Calyxo GmbH, Bitterfeld-Wolfen, Germany
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Firstpage
    1935
  • Lastpage
    1937
  • Abstract
    This paper presents Calyxo´s recent advances in product design that have resulted in independently confirmed peak aperture-area efficiencies of 13.4% for modules and 16.2% for cells. Some insight is given into a suitable product design for achieving the highest reliability possible, even in hot climates such as Australia. Several root-cause mechanisms influencing product stability in the field are discussed. Attention is paid to both design of the actual electronic device for upmost stability in the field as well as for the selection of materials of construction for the design of the actual module laminate. The paper will also present examples of a variety of accelerated testing´s as useful tools to choose between different concepts during product development as well as for quality assurance during module manufacturing. These technical advances and the midterm production-cost target of less than US$0.50/Wp allow a forecast of levelized cost of electricity (LCOE) of significantly under US$0.10/KWh, especially in sunny regions of the world.
  • Keywords
    cadmium compounds; life testing; semiconductor device reliability; semiconductor device testing; CdTe; accelerated testing; actual module laminate; efficiency 13.4 percent; efficiency 16.2 percent; electronic device; hot climates; levelized cost of electricity; product design; product development; product stability; root cause mechanisms; Heating; Laminates; Meteorology; Product design; Stress; Thermal stability; Cadmium Telluride; performance; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/PVSC.2013.6744848
  • Filename
    6744848