Electroluminescence and thermal imaging of large-area Cu(In, Ga)Se2 modules

Spatially resolved electroluminescence (EL) and thermal imaging are utilized to identify scribing failures and device defects in large-area Cu(In, Ga)Se₂ modules. EL emission from modules under forward bias was captured by a NIR CCD camera. Thermal images under the same forward bias conditions were taken by a far IR camera. By combining measurements of EL imaging, thermal imaging, and hand-held microscopy, various EL imaging patterns have been explored and different scribing failure modes in the modules have been identified. This work demonstrates a methodology for evaluating some module performance loss mechanisms and allows quick feedback for production optimization.