DocumentCode :
683152
Title :
Study of semiconductor nitrides thin films for photovoltaic (PV) applications
Author :
Santana-Rodriguez, G. ; de Melo, O. ; Lopez-Lopez, M. ; de Moure Flores, F. ; Hernandez-Hernandez, L.A. ; Aguilar-Hernandez, J. ; Mendoza-Perez, R. ; Rojas-Trigos, J.B. ; Contreras-Puente, G. ; Zamora, L.
Author_Institution :
Inst. de Investig. en Mater., UNAM, Mexico City, Mexico
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
2127
Lastpage :
2130
Abstract :
We present in this work results on semiconductor nitride thin films as grown by Close Space Vapor Transport (CSVT) and Laser Ablation (LA). The films were processed in different substrates and were characterized by X-Ray Diffraction, Scanning Electron Microscopy, Energy Dispersive Spectroscopy, Transmission Electron Microscopy (TEM) and Photoluminescence (PL). The processed films are conformed by substrate/GaN or /n-GaN or /p-GaN. In general the results indicate that the films are suitable for photovoltaic applications. We discuss our results according to the present state of the art of the PV devices of these materials.
Keywords :
X-ray chemical analysis; X-ray diffraction; gallium compounds; nitrogen compounds; photoluminescence; semiconductor thin films; solar absorber-convertors; solar cells; thin films; transmission electron microscopy; GaN; PV applications; PV devices; TEM; X-ray diffraction; close space vapor transport; energy dispersive spectroscopy; laser ablation; photoluminescence; photovoltaic applications; scanning electron microscopy; semiconductor nitrides thin films; transmission electron microscopy; Cities and towns; Films; Gallium nitride; Photonic band gap; Photovoltaic systems; Substrates; CSVT; PLD; Photoluminiscence; XRD; gallium nitrides; solar cells;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6744894
Filename :
6744894
Link To Document :
بازگشت