Title :
High efficiency screen-printed 156cm2 solar cells on thin epitaxially grown silicon material
Author :
Chia-Wei Chen ; Upadhyaya, Ajay ; Ruiying Hao ; Upadhyaya, Vijaykumar ; Keane, John ; Zimbardi, Francesco ; Kadish, Malka ; Pham, Iq ; Ning, Sheyang ; Ravi, K.V. ; Ravi, T.S. ; Rohatgi, Ajeet
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. Center of Excellence for Photovoltaic Res. & Educ., Atlanta, GA, USA
Abstract :
This paper demonstrates an epitaxial silicon based technology from wafer to module that can greatly reduce Kerf loss and give high efficiency. Porous Si layer was formed on a reusable Si substrate to grow and transfer thin epi layers. 17.2% cell efficiency on thin, 156cm2 large epitaxially grown Si (Epi-Si) wafers was achieved with tabs under glass/EVA. This is equivalent to ~18.0% uncapsulated cell tested in air, assuming 5% encapsulated loss. The built-in epi Back Surface Field (BSF) gave a Back Surface Recombination Velocity (BSRV) value of 500 cm/s. Bulk lifetime of 120us was achieved in ~3ohm-cm epi-wafers and no light induced degradation was observed in the cells. Further improvement of back passivation can lead to even higher efficiency.
Keywords :
elemental semiconductors; porous semiconductors; semiconductor epitaxial layers; silicon; solar cells; BSF; BSRV; Kerf loss; Si; back passivation; back surface field; back surface recombination velocity; bulk lifetime; epi-Si wafers; epitaxial silicon based technology; epitaxially grown Si wafers; glass-EVA; porous Si layer; reusable Si substrate; solar cells; thin epi layers; thin epitaxially grown silicon material; Epitaxial growth; Glass; Photovoltaic cells; Photovoltaic systems; Silicon; Substrates; layer transfer; porous silicon; screen-printing; thin silicon;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
DOI :
10.1109/PVSC.2013.6744907