Title :
Evaluation of cell to module losses for n-type IBC solar cells assembled with state of the art consumables and production equipment
Author :
Halm, A. ; Schneider, A. ; Mihailetchi, Valentin D. ; Libal, J. ; Aulehla, S. ; Galbiati, G. ; Roescu, R. ; Comparotto, Corrado ; Kopecek, Radovan ; Peter, K.
Author_Institution :
Int. Solar Energy Res. Center (ISC), Konstanz, Germany
Abstract :
In this paper we present an investigation on different aspects of the module assembly for back contacted n-type solar cells; in our case implemented on ISC´s “Zebra” IBC cell. With all contacts on the rear, new possibilities and challenges arise. The study is conducted on one cell mini-modules, “rear half”- and “front half”- mini-modules. It is aiming to minimize the overall cell to module (CTM) loss and to maximize module robustness against climate chamber tests. Electrical losses are evaluated using different interconnection schemes whereby optical losses are studied by utilizing novel encapsulant layers; long term stability is probed with climate chamber testing (TC200/400), PID and surface polarization tests.
Keywords :
assembling; integrated circuit interconnections; losses; production equipment; solar cells; CTM loss; ISC zebra IBC cell; PID; back contacted n-type solar cells; cell minimodules; cell-to-module losses evaluation; climate chamber testing; climate chamber tests; electrical losses; front half minimodules; interconnection schemes; long term stability; module assembly; module robustness maximization; n-type IBC solar cells; optical losses; production equipment; rear half minimodules; surface polarization tests; Conductive adhesives; Loss measurement; Meteorology; Optical losses; Photovoltaic cells; Silver; Soldering; CTM loss; IBC cell; PID test; TC 400; TC200; conductive adhesive; encapsulant; surface polarization;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
DOI :
10.1109/PVSC.2013.6744950
