DocumentCode :
683237
Title :
Tunnel-junction-free GaAs/Si tandem solar cells by self-aligned wafer bonding technology
Author :
Ruizhe Yao ; Zihao Wang ; Kuperinik, Jacob ; Weiming Wang ; Wei Guo
Author_Institution :
Rochester Inst. of Technol., Rochester, NY, USA
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
2483
Lastpage :
2485
Abstract :
GaAs/Si double junction solar cells are demonstrated by novel self-aligned wafer bonding techniques. The GaAs top junction is grown by metalorganic chemical vapor deposition (MOCVD) and the Si bottom junction is achieved by ion implantation. The two-junction solar cells are connected in series by Au/Si eutectic bonding, where the top and bottom cells were self-aligned by utilizing the Au/Si eutectic alloy as the interconnection metals and GaAs top cells as the etching mask. The Au/Si eutectic bonding was characterized by transmission electron microscope (TEM), scanning electron microscope (SEM) and current-voltage (I-V) measurements. A moderate conversion efficiency improvement of the GaAs/Si tandem cells compared to GaAs single junction cells is measured, while tandem cells with different top and bottom cell areal ratios are also investigated to achieve better current matching.
Keywords :
MOCVD; electric current measurement; scanning electron microscopy; solar cells; transmission electron microscopy; voltage measurement; GaAs-Si; current matching; current-voltage measurements; double junction solar cells; eutectic bonding; metalorganic chemical vapor deposition; scanning electron microscope; self-aligned wafer bonding technology; single junction cells; transmission electron microscope; tunnel-junction-free; Bonding; Gallium arsenide; Gold; Junctions; Photovoltaic cells; Silicon; GaAs/Si; eutectic bonding; self-aligned; tandem cells;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6744979
Filename :
6744979
Link To Document :
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