Title : 
Type conversion of p-SnS to n-SnS using a SnCl4/CH3OH heat treatment
         
        
            Author : 
Nwofe, P.A. ; Reddy, K. T. Ramakrishna ; Miles, R.W.
         
        
            Author_Institution : 
Northumbria Photovoltaics Applic. Centre, Northumbria Univ., Newcastle upon Tyne, UK
         
        
        
        
        
        
            Abstract : 
Thin films of tin sulphide were prepared at varying thicknesses with a deposition rate of 2 nm/s using the thermal evaporation method. Some films were then dipped in a solution containing tin (IV) chloride in methanol (SnCl4/CH3OH) at varying concentrations and then annealed in air at annealing temperatures ≥ 400°C and annealing times ≥ 60 min. The effects of the treatments on the structural, optical and electrical properties of the layers were investigated. The structural, optical and electrical properties of the as-deposited layers exhibited a thickness dependent behaviour. It was found that the SnCl4/CH3OH heat treatments convert the SnS layers from p-type to n-type in a controllable way. This process could be used to produce SnS homojunction solar cells or to passivate the grain boundaries in p-type SnS layers.
         
        
            Keywords : 
IV-VI semiconductors; Raman spectra; annealing; electrical conductivity; infrared spectra; semiconductor growth; semiconductor thin films; tin compounds; ultraviolet spectra; vacuum deposition; visible spectra; CH3OH; SnS; annealing; deposition; dipping; electrical properties; film thickness; grain boundaries; heat treatment; homojunction solar cells; methanol; optical properties; p-type-to-n-type conversion; passivation; structural properties; thermal evaporation; thin films; tin (IV) chloride; Annealing; Conductivity; Optical films; Photovoltaic cells; Reflection; Tin; annealing; film thickness; homojunction; type-conversion;
         
        
        
        
            Conference_Titel : 
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
         
        
            Conference_Location : 
Tampa, FL
         
        
        
            DOI : 
10.1109/PVSC.2013.6744988