DocumentCode :
683271
Title :
Fabrication and characterization of Si/ZnO branched heterojunction structures
Author :
Al-Hilo, Alaa A. ; Mohammed, Muatez Z. ; Armstrong, J.C. ; Jingbiao Cui ; Tar-Pin Chen
Author_Institution :
GREEN Solar cell Res. Center, Univ. of Arkansas at Little Rock, Little Rock, AR, USA
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
2628
Lastpage :
2632
Abstract :
We have fabricated branched heterojunction structures by growing horizontal ZnO nanowires (ZnONWs) on vertical Si nanowires (SiNWs). The SiNWs were fabricated by chemical etching of Si wafers, while the ZnONWs were grown in solution by an electrochemical process. Structure and electrical properties of the branched NWs studied by SEM, XDR, and electrical measurements. The SEM images show that 3-D branched SiNWs with ZnONWs branches were successfully grown. Due to its light trapping effect this special structure may have applications in photovoltaic devices. Solar cells based on the branched structure were also fabricated and tested. We found that their cell performance depends on the length of both the SiNWs and the ZnONWs, as well as the thickness of ZnO seed layer.
Keywords :
II-VI semiconductors; X-ray diffraction; elemental semiconductors; etching; nanofabrication; nanowires; scanning electron microscopy; semiconductor growth; semiconductor heterojunctions; silicon; solar cells; wide band gap semiconductors; zinc compounds; SEM; Si-ZnO; XRD; branched heterojunction structures; chemical etching; electrical properties; electrochemical process; horizontal zinc oxide nanowires; light trapping effect; photovoltaic devices; solar cells; vertical silicon nanowires; Current measurement; Etching; Heterojunctions; Nanowires; Photovoltaic cells; Silicon; Zinc oxide; Si nanowires; ZnO nanowires; ZnO seed layer; heterojection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6745013
Filename :
6745013
Link To Document :
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