Title :
Outdoor performance testing of thin-film PV modules in the hot and humid climate
Author :
Dhere, Neelkanth G. ; Kaul, A. ; Pethe, Shirish A. ; Schneller, Eric ; Shiradkar, Narendra S.
Author_Institution :
Florida Solar Energy Center, Cocoa, FL, USA
Abstract :
Results from outdoor exposure testing of thin-film PV modules from various US manufacturers are being presented. The modules were deployed in the hot and humid climate of Florida. The duration of the exposure ranged between 2½ to over 6 years for various technologies. PVUSA type regression analysis was carried out for the continuously measured output power from the PV arrays to study their performance variation with time. Annual energy yield was also determined for the duration of this study. Estimates of performance degradation are provided so as to assist in the compilation of degradation data for the Thin Film PV Module Task Group 8 of International Quality Assurance Task Force.
Keywords :
integrated circuit testing; regression analysis; semiconductor thin films; solar cell arrays; thin film devices; Florida; International Quality Assurance Task Force; PV arrays; PVUSA type regression analysis; annual energy yield; degradation data compilation; hot climate; humid climate; outdoor exposure testing; outdoor performance testing; performance degradation estimation; thin film PV module task group 8; Arrays; Degradation; Junctions; Market research; Meteorology; Photovoltaic systems; Testing; CIGS; CdTe; a-Si:H; semiconductor device reliability; thin film;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
DOI :
10.1109/PVSC.2013.6745092
