DocumentCode :
683362
Title :
Simulation and development of sub-wavelength grated dielectric ARCs for CPV applications
Author :
Wei Wang ; Freundlich, Alex
Author_Institution :
Univ. of Houston, Houston, TX, USA
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
3049
Lastpage :
3052
Abstract :
Here, and in an attempt to identify a better alternative to the conventional dual layer ARCs for III-V multi-junction concentrator cells operating with or without protective cover glass in conjunction with wide acceptance angles, we have undertaken a systematic analysis of design parameters and angular dependent antireflective properties of dielectric grating formed, through the implementation of sub-wavelength arrays of 2D pyramidal gratings of ZnS and TiO2. Though the study indicated no or limited improvement for devices operating with a SiO2 like cover glass, in the absence of a cover the evaluation indicates that through a careful selection of the design these dielectric gratings can reduce reflection-loss related current losses by 2-3 fold by comparison to their planar double layer ARC counterparts. i.e. for a 3J metamorphic device this lead to a current improvement of 0.7 mA/cm2 for a 60 degree acceptance angles.
Keywords :
II-VI semiconductors; antireflection coatings; diffraction gratings; light reflection; optical losses; solar cell arrays; solar energy concentrators; titanium compounds; wide band gap semiconductors; zinc compounds; 2D pyramidal gratings; CPV applications; III-V multijunction concentrator cells; SiO2; TiO2; ZnS; angular dependent antireflective property; dielectric grating; energy 3 J; metamorphic device; planar double layer ARC; protective cover glass; reflection loss reduction; subwavelength arrays; systematic design parameter analysis; Dielectrics; Glass; Gratings; Photovoltaic cells; Reflection; Refractive index; concentrated photovoltaic; cover glass; current loss; effective medium approach; texturing; transfer matrix method;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6745104
Filename :
6745104
Link To Document :
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