DocumentCode :
683403
Title :
New analysis of suns-Voc and Voc(T): A simple method to quantify recombination channels in solar cells
Author :
Grover, Sachit ; Li, Jian V. ; Young, David L. ; Stradins, Paul ; Branz, H.M.
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
1
Lastpage :
2
Abstract :
Analyzing regions of dominant recombination in a solar cell is crucial to guide process modifications and device improvements that improve efficiency. Common characterizations such as dark and light current-voltage and quantum efficiency provide only qualitative insights into the distribution of recombination in a solar cell, especially when the cell contains a heterojunction emitter. The open-circuit voltage (Voc) is a sensitive indicator of recombination since generation equals recombination at that bias. We leverage the light and temperature dependence of Voc to quantify recombination in the space-charge (SCR), quasi-neutral (QNR) and junction-inter face regions of heterojunction solar cell. By combining the operating conditions and recombination parameters into a common equation for Voc, we enable the separation of recombination in different regions of the cell and provide a meaningful interpretation of previously known variables.
Keywords :
semiconductor diodes; solar cells; surface recombination; dark current-voltage; device improvements; dominant recombination region analysis; heterojunction emitter; heterojunction solar cell; junction-inter face regions; light current-voltage; open-circuit voltage; process modifications; quantum efficiency; quasi-neutral face regions; recombination channel quantification; space-charge face regions; Equations; Heterojunctions; Mathematical model; Photovoltaic cells; Radiative recombination; Temperature dependence; Thyristors; Solar cells; heterojunction; ideality factor; intensity; open-circuit voltage; recombination; temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6745145
Filename :
6745145
Link To Document :
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