Title :
2.19 eV InGaP solar cells on GaP substrates
Author :
Tomasulo, Stephanie ; Faucher, J. ; Lang, Jordan R. ; Yaung, Kevin Nay ; Lee, Minjoo Larry
Author_Institution :
Yale Univ., New Haven, CT, USA
Abstract :
We have grown, via molecular beam epitaxy (MBE), the first metamorphic In0.26Ga0.74P solar cells with a 2.19 eV direct bandgap on GaP to serve as the top cell in a multi-junction device. Calculations show that the incorporation of a 2.0-2.2 eV top cell into future 4-6 junction cells could enable efficiencies as high as 60%. GaAsxP1-x graded buffers enabled a moderate threading dislocation density of 6×106 cm-2 in the In0.26Ga0.74P solar cells. Open circuit voltages (Voc) as high as 1.42 V were observed under approximate AM1.5G illumination. Little work has been reported on the MBE growth of such high-bandgap InyGa1-yP, and we believe that this Voc can be improved through systematic optimization of growth conditions. Although these devices were not optimized for current collection, we obtain an efficiency of 3.13%, surpassing that of the best GaP solar cells. Finally, as this composition is near the direct-indirect crossover point, we analyzed the low-energy cutoff of the external quantum efficiency spectrum and infer that our In0.26Ga0.74P cells are still in the direct regime.
Keywords :
III-V semiconductors; gallium compounds; indium compounds; molecular beam epitaxial growth; semiconductor thin films; solar cells; AM1.5G illumination; InGaP:GaP; MBE; cell efficiency; current collection; direct-indirect crossover point; electron volt energy 2.0 eV to 2.2 eV; external quantum efficiency spectrum; molecular beam epitaxy; multijunction solar cells; threading dislocation density; voltage 1.42 V; Gallium arsenide; Junctions; Molecular beam epitaxial growth; Photonic band gap; Photovoltaic cells; Substrates; InGaP; metamorphic; molecular beam epitaxy; wide-bandgap;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
DOI :
10.1109/PVSC.2013.6745162