• DocumentCode
    683427
  • Title

    Sensitivity analysis of materials availability for terawatt PV deployment

  • Author

    Jeffries, A. ; Bowden, Stuart ; Honsberg, C. ; Bertoni, M.

  • Author_Institution
    Arizona State Univ., Tempe, AZ, USA
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Firstpage
    3353
  • Lastpage
    3356
  • Abstract
    The road map for cost competitive large-scale PV deployment is ever changing and with PV grade poly silicon prices averaging 16 U$D/kg and companies focusing on using less materials the cost effectiveness of readily available materials for solar cell applications should be revisited. In this work we analyze to which extent the extraction cost of the absorber layer material plays a role in the overall cost of generating electricity, taking into account the potential for light trapping and the non-power producing component costs. Our calculations show that nearly all presently used materials have fundamental cost and availability potential which are well below a level at which material availability is a dominant consideration. Instead, constraints on parameters such as the amount of copper for wiring or substrate material for module fabrication become dominant issues.
  • Keywords
    elemental semiconductors; photovoltaic power systems; power generation economics; power generation reliability; pricing; sensitivity analysis; silicon; solar cells; PV grade polysilicon pricing; Si; absorber layer material cost extraction; copper; cost competitive large-scale PV deployment; electricity cost generation; material availability potential; module fabrication; nonpower producing component cost; sensitivity analysis; solar cell application; terawatt PV deployment; wiring; Electricity; Photovoltaic cells; Photovoltaic systems; Production; Silicon; BOS; Earth abundant materials; PV deployment; balance of systems; cost analysis; materials availability; solar cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/PVSC.2013.6745169
  • Filename
    6745169