Title :
Photo-dielectric polymers material characterizations for 3D packaging applications
Author :
Allouti, N. ; Chausse, Pascal ; Aumont, Christophe ; Issele, Helene ; Vignoud, Lionel ; Rochat, N. ; Poulain, C. ; Gasiglia, Magalie ; Sourd, Claire ; Argoud, Maxime ; Coudrain, P. ; Trouiller, Yorick
Author_Institution :
Leti MINATEC Campus, CEA, Grenoble, France
Abstract :
When considering wafer level packaging (WLP) applications, the use of dielectric polymer materials becomes more relevant for reliability performance. Indeed, polymer materials can have excellent dielectric performances with a processability at lower thermal balance. Their mechanical properties also offer a better compliance between the silicon 3D stack and the organic substrate underneath, improving the overall Front-End / Back End compatibility. This study reports the thermo-mechanical behavior and properties evaluation of the most advanced photo-sensitive dielectric polymers with higher resolution available in the market. It will allow direct comparisons between different dielectric polymer materials with the focus of stress control and thermal stability. First part of the paper will present thermal and mechanical characterization of these polymers performed with the same experimental conditions. Second part will present the advantages and limitations of each measurement characterization technique. And finally, the most relevant characterizations will be extracted in order to compare such dielectric polymers for 3D packaging applications.
Keywords :
dielectric materials; polymers; thermal stability; three-dimensional integrated circuits; wafer level packaging; 3D packaging applications; WLP applications; dielectric polymer materials; frontend-backend compatibility; measurement characterization technique; organic substrate; photosensitive dielectric polymers; reliability performance; silicon 3D stack; stress control; thermal stability; thermomechanical behavior; thermomechanical properties evaluation; wafer level packaging applications; Plastics; Polymers; Silicon; Stress; Substrates; Temperature measurement;
Conference_Titel :
Electronics Packaging Technology Conference (EPTC 2013), 2013 IEEE 15th
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-2832-3
DOI :
10.1109/EPTC.2013.6745677