DocumentCode :
683841
Title :
The effect of material interfaces on electrical tree growth and breakdown time of epoxy resin
Author :
Pattouras, M. ; Tzimas, A. ; Rowland, S.
Author_Institution :
Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester, UK
fYear :
2013
fDate :
20-23 Oct. 2013
Firstpage :
796
Lastpage :
799
Abstract :
This study investigates the effect of barriers and interfaces on the lifetime of epoxy resin samples, as well as the growth characteristics of electrical trees. Four sample types are presented; all having been prepared in the point-plane configuration using a hypodermic needle as the HV electrode. Tests were carried out at 13 kV rms and sample images were taken at fixed one minute intervals during the test period. Results show that the incorporation of a barrier improves the time to breakdown of the epoxy resin tested. The inclusion of a major void defect did not accelerate failure of a sample which included an effective barrier.
Keywords :
electrodes; needles; resins; trees (electrical); HV electrode; electrical tree growth; epoxy resin breakdown time; epoxy resin lifetime; growth characteristics; hypodermic needle; material interfaces effect; point-plane configuration; voltage 13 kV; Dielectrics; Electric breakdown; Electrodes; Epoxy resins; Insulation; Needles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
Conference_Location :
Shenzhen
Type :
conf
DOI :
10.1109/CEIDP.2013.6747070
Filename :
6747070
Link To Document :
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