DocumentCode :
683863
Title :
Influence of interfacial condition between film and lower electrode on space charge measurement
Author :
Murakami, Yasutaka ; Sugiyama, Takatoshi ; Funo, Ruji ; Fukuma, Masumi ; Nagao, Masaru
Author_Institution :
Toyohashi Univ. of Technol., Toyohashi, Japan
fYear :
2013
fDate :
20-23 Oct. 2013
Firstpage :
1062
Lastpage :
1065
Abstract :
One electrical insulation evaluation technology is the pulsed electroacoustic method, which detects the acoustic pressure due to the space charge in the bulk. To improve its reliability, a measurement system for the apparent acoustic impedance of the sample is introduced into the space charge measurement system. The apparent acoustic impedance of a polyethylene terephthalate film increases as the applied mechanical pressure increases. The position of the lower electrode signal shifts under a lower mechanical pressure and magnitude of the lower electrode signal decreases. The larger silicone oil layer lead to a charge shift due to interfacial polarization and a smaller magnitude of the pressure wave generated from the interface between the silicone oil layer and the sample.
Keywords :
acoustic impedance; charge measurement; electrochemical electrodes; insulation; power apparatus; pulsed electroacoustic methods; space charge; acoustic pressure detection; apparent acoustic impedance; electrical insulation evaluation technology; interfacial condition; interfacial polarization; lower electrode; mechanical pressure; polyethylene terephthalate film; polymeric insulating materials; power apparatuses; power transmission cost reduction; pressure wave generation; pulsed electroacoustic method; reliability improvement; silicone oil layer; space charge measurement system; Acoustic measurements; Acoustics; Charge measurement; Electrodes; Impedance; Positron emission tomography; Space charge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
Conference_Location :
Shenzhen
Type :
conf
DOI :
10.1109/CEIDP.2013.6747102
Filename :
6747102
Link To Document :
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