Nanosecond discharges with runaway electrons and X-rays in atmospheric pressure air, nitrogen, CH4, SF6, xenon, krypton, argon and helium

Author

Tarasenko, Victor F. ; Baksht, Evgenii Kh ; Burachenko, Alexander G. ; Erofeev, M.V. ; Kostyrya, Igor D. ; Lomaev, M.I. ; Rybka, Dmitri V. ; Sorokin, D.A.

Author_Institution

Inst. of High Current Electron., Tomsk, Russia

fYear

2013

fDate

20-23 Oct. 2013

Firstpage

622

Lastpage

625

Abstract

Diffuse discharges were formed in a highly nonuniform electric field by point-plane gaps in atmospheric pressure air, nitrogen, CH₄, SF₆, xenon, krypton, argon and helium by two nanosecond-pulse generators. The rise time of generators were 0.3 (SLEP-150) and 1 ns (RADAN-220), and a full width at half maximum (FWHM) were 1 and 2 ns, respectively. The variables affecting the discharge characteristics, including the gap spacing d and applied pulse parameters, were investigated. With both generators supershort avalanches electron beam (SAEB) and X-rays were obtained. The characteristics of measured SAEB and X-rays on the all generators were studied. With Generator #1 in atmospheric pressure air it was obtained that FWHM of the total SAEB current pulse from the entire foil area is ̃ 100 ps and the amplitude of SAEB ̃ 100 A. With Generator #2 in all gases at the pressure of one atmosphere SAEB was registered.

Keywords

argon; atmospheric pressure; discharges (electric); helium; krypton; nitrogen; xenon; Ar; CH₄; FWHM; He; Kr; N; RADAN-220; SAEB; SF₆; SLEP-150; Xe; applied pulse parameters; atmospheric pressure air; full width at half maximum; gap spacing; nanosecond discharges; nanosecond-pulse generators; nonuniform electric field; point-plane gaps; runaway electrons; supershort avalanches electron beam; time 0.3 ns; time 1 ns; time 2 ns; x-rays; Anodes; Cathodes; Discharges (electric); Electron beams; Generators; Nitrogen; Sparks;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on

Conference_Location

Shenzhen

Type

conf

DOI

10.1109/CEIDP.2013.6747104

Filename

6747104