Title :
High temperature behavior of ceramic substrates for power electronics applications
Author :
Roske, L. ; Lebey, T. ; Valdez-Nava, Zarel
Author_Institution :
Lab. Laplace, Univ. de Toulouse, Toulouse, France
Abstract :
Aluminium oxide (Al2O3), Aluminium Nitride (AlN) and Silicon Nitride (Si3N4) are ceramics commonly used in power electronics modules, and are the current candidates for high temperature applications. A first study has previously shown different charge displacement behaviors at high temperature (up to 400°C). Surface potential measurements revealed a fast decay for AlN and Al2O3 with the increase of the temperature while on Si3N4 charges remain on surface at 400°C. However, these charges may move through the surface or be injected in the volume of the ceramics. - Surface potential results are correlated with broadband impedance spectroscopy and to current-voltage measurements of the ceramics. AlN and Al2O3 have a resistive-like behavior at high temperature, characterized by a space charge limited conduction current mechanism at high fields. For Si3N4, despite its resistivity decreases with temperature, it shows a dielectric behavior and an ohmic conduction mechanism over the studied temperature and field ranges.
Keywords :
III-V semiconductors; aluminium compounds; ceramic packaging; electric current measurement; electrical resistivity; silicon compounds; space-charge-limited conduction; surface charging; surface potential; voltage measurement; wide band gap semiconductors; Al2O3; AlN; Si3N4; aluminium nitride; aluminium oxide; broadband impedance spectroscopy; ceramic substrate; current-voltage measurement; dielectric behavior; high temperature behavior; ohmic conduction mechanism; power electronics module; resistivity; silicon nitride; space charge limited conduction current mechanism; surface potential measurement; temperature 400 degC; Aluminum oxide; Ceramics; Current measurement; Electric potential; Surface impedance; Temperature; Temperature measurement;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
Conference_Location :
Shenzhen
DOI :
10.1109/CEIDP.2013.6748139