DocumentCode
684105
Title
Measurement of pollution level of 66 kV transmission line insulators
Author
Salam, M.A. ; Ang, S.P. ; Ong, Bun Theang ; Malik, Owais A. ; Voon, William ; Alinurrezan, M.
Author_Institution
Dept. of Electr. & Electron. Eng., Inst. Technol. Brunei, Gadong, Brunei
fYear
2013
fDate
20-23 Oct. 2013
Firstpage
1124
Lastpage
1127
Abstract
The presence of unwanted constituent on insulator surface of transmission tower plays an important ignition property for the likelihood of occurrence of flashover. In this paper, the pollution level of two aged insulators namely the longrod silicon rubber and the cap-and-pin glass insulators are measured. The results from the measurement shows that the Equivalent Salt Deposit Density (ESDD) of the cap-and-pin glass insulator, particularly near the pin is found to be 0.169 mg/cm2 while the composition over the cap surface is 0.136 mg/cm2. For the case of longrod silicon rubber insulator, the ESDD for both the pin and the cap are found to be 0.063 mg/cm2 and 0.016 mg/cm2 respectively. The outcomes from the ESDD measurements suggest that the cap-and-pin glass insulator string is severely contaminated with salt spray as compared to the longrod silicon rubber. Furthermore, a mathematical model of ESDD expressed in terms of salinity and temperature for both insulators is derived from multivariable regression method. The coefficients for both the cap-and-pin glass and longrod silicon rubber insulator are found to be 0.9984 and 0.9867 respectively.
Keywords
insulator contamination; pollution measurement; power transmission lines; ESDD; aged insulators; cap-and-pin glass insulators; equivalent salt deposit density; longrod silicon rubber; pollution level measurement; salinity; transmission line insulators; voltage 66 kV; Conductivity; Glass; Pollution; Rubber; Silicon; Temperature measurement; ESDD; Salt-solution; cap-and-pin glass and silicon rubber insulators; regression analysis; salinity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
Conference_Location
Shenzhen
Type
conf
DOI
10.1109/CEIDP.2013.6748144
Filename
6748144
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