• DocumentCode
    68455
  • Title

    Triple Loop Modulation (TLM) for High Reliability and Efficiency in a Power Factor Correction (PFC) System

  • Author

    Tsai, Jen-Chieh ; Ni, Chia-Lung ; Chen, Chi-Lin ; Chen, Yi-Ting ; Chen, Chun-Yen ; Chen, Ke-Horng

  • Author_Institution
    Inst. of Electr. Control Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    28
  • Issue
    7
  • fYear
    2013
  • fDate
    Jul-13
  • Firstpage
    3447
  • Lastpage
    3458
  • Abstract
    The proposed triple loop modulation (TLM) can ensure reliability of the power factor correction (PFC) system due to the improvement of transient response. In conventional design, low bandwidth of less than 20 Hz that rejects ac source of 60/120 Hz coupling deteriorates system reliability in case of output load variation. Contrarily, the proposed TLM can automatically adjust bandwidth to rapidly increase or decrease inductor current to shorten transient response time. Besides, in the steady state, system stability can be guaranteed by low-frequency compensation pole without being affected by the TLM. The test circuit fabricated in a VIS 500 V UHV laterally diffused metal-oxide-semiconductor transistor process demonstrates that the highly integrated PFC controller with the proposed TLM has high power factor of 99%, high efficiency of 95%, and high power driving capability of about 90 W. The improvement in transient response is twofold faster than in conventional PFC design with output load variation from 90 to 20 W and vice versa.
  • Keywords
    MOSFET; modulation; power factor correction; power inductors; power system reliability; power system stability; transient response; TLM; UHV laterally diffused metal-oxide-semiconductor transistor process; VIS; coupling deterioration; efficiency 95 percent; frequency 120 Hz; frequency 60 Hz; highly integrated PFC controller; inductor current; low-frequency compensation pole; output load variation; power 90 W to 20 W; power driving capability; power factor correction system; reliability; system stability; test circuit fabrication; transient response improvement; transient response time; triple loop modulation; voltage 500 V; Bandwidth; Modulation; Reliability; Time domain analysis; Time varying systems; Transient response; Fast transient response; power factor correction (PFC); triple loop modulation (TLM);
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2012.2227506
  • Filename
    6353635