DocumentCode
68482
Title
Extraction of the Random Component of Time-Dependent Variability Using Matched Pairs
Author
Kaczer, Ben ; Franco, Jacopo ; Roussel, Philippe J. ; Groeseneken, Guido ; Chiarella, Thomas ; Horiguchi, Naoto ; Grasser, Tibor
Author_Institution
imec, Leuven, Belgium
Volume
36
Issue
4
fYear
2015
fDate
Apr-15
Firstpage
300
Lastpage
302
Abstract
Based on the so-called defect-centric statistics, we propose the average impact of a single charged trap on FET threshold voltage as a physically based measure of the random component of time-dependent variability. We show that it can be extracted using matched pairs, analogously to time-zero variability. To that end, the defect-centric statistics of matched pairs are discussed and the correlation between time-zero and time-dependent variances is formalized.
Keywords
field effect transistors; statistical analysis; FET threshold voltage; defect-centric statistics; matched pairs; random component; single charged trap; time-dependent variability; Correlation; Degradation; Logic gates; Reliability; Stress; Systematics; Threshold voltage; FinFETs; Matched Pairs; Reliability; Variability; matched pairs; reliability;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2015.2404293
Filename
7042778
Link To Document