DocumentCode
684885
Title
A novel lie detection method based on extreme learning machine using P300
Author
Yijun Xiong ; Yong Yang ; Junfeng Gao
Author_Institution
Coll. of Mech. & Electr. Eng., Wuhan Donghu Univ., Wuhan, China
fYear
2012
fDate
7-9 Dec. 2012
Firstpage
1
Lastpage
4
Abstract
Machine learning-based lie detection has drawn much attention recently. In this paper, we used extreme learning machine (ELM), a recently-proposed machine learning method based on a single layer feedforward network (SLFN), to classify P300 potentials from guilty subject and non-P300 potentials from innocent subject. Back-propagation network and support vector machine classifiers were also used to compare with the proposed method. The number of hidden nodes in ELM was tuned using training with the 10-fold cross validation. The experimental results show that the proposed method reaches the highest classification accuracy with extremely less training and testing time, compared with the other classification models.
Keywords
backpropagation; bioelectric potentials; feedforward neural nets; medical signal processing; support vector machines; ELM; P300 potential; SLFN; backpropagation network; extreme learning machine; lie detection method; single layer feedforward network; support vector machine classifier; Lie detection; P300; Probe stimuli; extreme learning machine;
fLanguage
English
Publisher
iet
Conference_Titel
Information Science and Control Engineering 2012 (ICISCE 2012), IET International Conference on
Conference_Location
Shenzhen
Electronic_ISBN
978-1-84919-641-3
Type
conf
DOI
10.1049/cp.2012.2471
Filename
6755850
Link To Document