Title :
A novel lie detection method based on extreme learning machine using P300
Author :
Yijun Xiong ; Yong Yang ; Junfeng Gao
Author_Institution :
Coll. of Mech. & Electr. Eng., Wuhan Donghu Univ., Wuhan, China
Abstract :
Machine learning-based lie detection has drawn much attention recently. In this paper, we used extreme learning machine (ELM), a recently-proposed machine learning method based on a single layer feedforward network (SLFN), to classify P300 potentials from guilty subject and non-P300 potentials from innocent subject. Back-propagation network and support vector machine classifiers were also used to compare with the proposed method. The number of hidden nodes in ELM was tuned using training with the 10-fold cross validation. The experimental results show that the proposed method reaches the highest classification accuracy with extremely less training and testing time, compared with the other classification models.
Keywords :
backpropagation; bioelectric potentials; feedforward neural nets; medical signal processing; support vector machines; ELM; P300 potential; SLFN; backpropagation network; extreme learning machine; lie detection method; single layer feedforward network; support vector machine classifier; Lie detection; P300; Probe stimuli; extreme learning machine;
Conference_Titel :
Information Science and Control Engineering 2012 (ICISCE 2012), IET International Conference on
Conference_Location :
Shenzhen
Electronic_ISBN :
978-1-84919-641-3
DOI :
10.1049/cp.2012.2471