• DocumentCode
    684968
  • Title

    Fault detection of analog circuits by using transient output voltage

  • Author

    Chaojie Zhang ; Guo He ; Guanghui Chang

  • Author_Institution
    Coll. of Power Eng., Naval Univ. of Eng., Wuhan, China
  • Volume
    01
  • fYear
    2013
  • fDate
    16-18 Aug. 2013
  • Firstpage
    17
  • Lastpage
    21
  • Abstract
    With the rapid development of integrated circuits technology, fewer and fewer circuit nodes are accessible for analog fault detection. In this research, the transient output voltage of analog circuits was used for fault detection. The circuits was stimulated by a transient signal source. It´s transient output voltage was measured and analyzed. Then we extracted the features of this signal. Principal component analysis was used to combine these features and detect faults of circuits-under-test. The main advantages of this method is the single test point. Only the transient output voltage signal is measured for practical application. As an example, the proposed method was used for fault detection of the signal filtering and amplifying circuit, which was used in the ultrasonic liquid-level sensor. And we compare the results with those using other methods. From the comparing results, we can see that the proposed method have a higher fault detection accuracy.
  • Keywords
    amplifiers; analogue integrated circuits; fault diagnosis; filters; integrated circuit testing; level meters; principal component analysis; transients; amplifying circuit; analog fault detection; analog integrated circuits; circuits-under-test; principal component analysis; signal filtering; single test point; transient output voltage; transient signal source; ultrasonic liquid-level sensor; Accuracy; Acoustics; Frequency locked loops; Ultrasonic variables measurement; Voltage measurement; analog circuits; fault detection; signal processing; transient output voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Measurement, Information and Control (ICMIC), 2013 International Conference on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4799-1390-9
  • Type

    conf

  • DOI
    10.1109/MIC.2013.6757907
  • Filename
    6757907