• DocumentCode
    684990
  • Title

    Device characteristics of vertical organic photoelectric transistor

  • Author

    Yue Zhang ; Dongxing Wang ; Yue Shan ; Jiabin Chen ; Hao Zhang ; Jinghua Yin ; Hong Zhao

  • Author_Institution
    Dept. of Electron. Sci. & Technol., Harbin Univ. of Sci. & Technol., Harbin, China
  • Volume
    01
  • fYear
    2013
  • fDate
    16-18 Aug. 2013
  • Firstpage
    198
  • Lastpage
    201
  • Abstract
    Vertical organic photoelectric transistors (OPTs) with copper phthalocyanine (CuPc) as active layers have been fabricated. The structure of OPTs fabricated consists of five layers of Cu/CuPc/Al/CuPc/ indium tin oxide (ITO). Compared with traditional organic field effect transistor (OFETs), the structure of vertical conductive channel in OPTs is advanced to static characteristics with high working current value, low operation voltage and large switching current ratio. The static current-voltage output characteristics of OPTs in 700 nm light and in dark are observed. It can be seen that emitter-collector current (Iec) increases steadily with the increase of emitter-collector voltage (Vec). But Iec decreases with the increase o f base voltage (Vb), and that is the increase of Schottky barrier in base region. The operation current in 700 nm light is larger than the one in dark. The switching current ratio is 14.5.
  • Keywords
    Schottky barriers; copper; copper compounds; indium compounds; organic field effect transistors; organic semiconductors; photoelectric devices; Cu; ITO; Schottky barrier; emitter-collector current; emitter-collector voltage; large switching current ratio; static characteristics; vertical organic photoelectric transistor; wavelength 700 nm; Electrodes; Films; Indium tin oxide; OFETs; Optimized production technology; Schottky barriers; organic semiconductor; space charge limited current; thin film transistor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Measurement, Information and Control (ICMIC), 2013 International Conference on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4799-1390-9
  • Type

    conf

  • DOI
    10.1109/MIC.2013.6757946
  • Filename
    6757946