• DocumentCode
    684991
  • Title

    Laminated structure of organic thin-film transistors preparation and gas sensing characteristics

  • Author

    Jing-yi Xu ; Dong-xing Wang ; Wei Liu ; Lei Wang ; Bin An ; Jing-hua Yin ; Hong Zhao

  • Author_Institution
    Key Lab. of Eng. Dielectr. & Its Applic., Harbin Univ. of Sci. & Technol., Harbin, China
  • Volume
    01
  • fYear
    2013
  • fDate
    16-18 Aug. 2013
  • Firstpage
    202
  • Lastpage
    205
  • Abstract
    Using the vacuum deposition method and the organic semiconductor copper phthalocyanine make of the structure of Au (Emitte)/CuPc/Al (Base)/CuPc/Au (Collector) the five-layer laminate structure organic transistor sensor. Specially appointed gases such as O2, NO2 will occur oxidation-reduction reduction when they were absorbed by the emitting region´s organic thin film of organic transistor sensors, which equals to the doping effect of donor or acceptor, caused the change of carrier in organic film. To increase or decrease the carrier emitted by the source, the tunneling CuPc/Al/ CuPc double Schottky Barrier[10] gate region is formed operating current and changed. According to measuring the current change of organic transistor sensor to determined a specific gas.
  • Keywords
    Schottky barriers; aluminium; copper compounds; gas sensors; gold; laminations; organic field effect transistors; organic semiconductors; thin film sensors; thin film transistors; vacuum deposition; doping effect; five-layer laminate structure organic transistor sensor; gas sensing characteristics; organic semiconductor copper phthalocyanine; organic thin-film transistor preparation; oxidation-reduction; region organic thin film; tunneling double Schottky barrier gate region; vacuum deposition method; Films; Gold; Logic gates; Polymers; Semiconductor device measurement; Transistors; an organic thin film transistor; an organic transistor sensor; copper phthalocyanine; organic tunneling transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Measurement, Information and Control (ICMIC), 2013 International Conference on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4799-1390-9
  • Type

    conf

  • DOI
    10.1109/MIC.2013.6757947
  • Filename
    6757947