DocumentCode :
685401
Title :
A novel 4H-SiC VDMOS utilizing fully depleted p-body structure
Author :
Yunbin Gao ; YouRun Zhang ; Haoran Wu ; Bo Zhang Ying Liu
Author_Institution :
State key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Dongguan, China
Volume :
1
fYear :
2013
fDate :
15-17 Nov. 2013
Firstpage :
331
Lastpage :
334
Abstract :
A novel n-channel VDMOS fabricated on 4H-SiC is reported. This device is a distinct double-layer structure with an ultra-thin n-doped region under a fully depleted p-body region in the channel region which induces a larger amount of carriers when the gate bias exceeds the threshold voltage, with little leakage current in off-state. As a result, the specific on-resistance of the VDMOS is 6.21 mΩ·cm2, which is obviously reduced comparing with a conventional structure as good as the blocking voltage of nearly 1000V.
Keywords :
MOSFET; leakage currents; silicon compounds; wide band gap semiconductors; 4H-SiC VDMOS; SiC; double-layer structure; fully depleted p-body structure; n-channel VDMOS; threshold voltage; ultra-thin n-doped region; Doping; Electric breakdown; Leakage currents; Logic gates; Scattering; Silicon carbide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications, Circuits and Systems (ICCCAS), 2013 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4799-3050-0
Type :
conf
DOI :
10.1109/ICCCAS.2013.6765245
Filename :
6765245
Link To Document :
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