DocumentCode :
685410
Title :
FaSEA: Fast single-trunk detailed router for electromigration avoidance
Author :
Jihua Zhang ; Hailong Yao
Author_Institution :
Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Volume :
1
fYear :
2013
fDate :
15-17 Nov. 2013
Firstpage :
395
Lastpage :
398
Abstract :
The operating current in analog circuit is typically much larger than that in digital circuits. Electromigration due to large current and insufficient wire width can cause both short-circuit and open-circuit failures, which may lead to circuit malfunctions. Such electromigration issues become increasingly important because the feature sizes keep shrinking. Existing works on electromigration-aware routing mostly focus on wiring topology computation without considering obstacles. Such wiring topologies can result in degraded detailed routing solutions due to routing obstacles and ineffective detailed routers. In this paper, we present a new efficient detailed router, called FaSEA, for electromigration avoidance based on a single-trunk heuristic. FaSEA can obtain a detailed routing solution for a given multiterminal net with multiple current sources and sinks, which avoids obstacles and satisfies Kirchhoff´s current law with variable wire widths. Experimental results are promising and show the effectiveness of FaSEA.
Keywords :
electromigration; telecommunication network reliability; telecommunication network routing; telecommunication network topology; FaSEA; Kirchhoff´s current law; analog circuit; circuit malfunctions; digital circuits; electromigration avoidance; electromigration aware routing; fast single trunk detailed router; multiple current sources; multiterminal net; open circuit failures; operating current; routing obstacles; short circuit; single trunk heuristic; wiring topology computation; Algorithm design and analysis; Current density; Electromigration; Routing; Topology; Wires; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications, Circuits and Systems (ICCCAS), 2013 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4799-3050-0
Type :
conf
DOI :
10.1109/ICCCAS.2013.6765260
Filename :
6765260
Link To Document :
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