Title :
A study on optimized layout transformation algorithm
Author :
Changjiang Li ; Junping Wang ; Dan Xu ; Yanhong Gao
Author_Institution :
Dept. of Commun. Eng., Xidian Univ., Xi´an, China
Abstract :
In the prediction and improvement of integrated circuit yield, converting the optimized layout image to a standard format is necessary. This paper presents a new algorithm to recognize maximal rectangles based on single net structure. In an optimized layout image, we get all candidates through scanning the border. According the correspondence between candidates and maximal rectangles, we identify the maximal rectangles under constrain condition of candidates. Then we extract the information of standard rectangle graphic unit as width, height and center coordinate. This paper identifies all internal rectangles with which to assemble complex graphics. We complete the transformation by assembling all statistical data of maximal rectangles. We verify this algorithm and implementation in common net structure. The algorithm does well in the transformation from optimized layout image to standard format.
Keywords :
image processing; integrated circuit layout; integrated circuit yield; candidates; complex graphics; integrated circuit yield; internal rectangles; maximal rectangles; optimized layout image; single net structure; standard format; standard rectangle graphic unit; statistical data; Image color analysis; Integrated circuits; Layout; Manufacturing; Presses; Standards; Candidates; Maximal rectangle; Net structure;
Conference_Titel :
Anti-Counterfeiting, Security and Identification (ASID), 2013 IEEE International Conference on
Conference_Location :
Shanghai
DOI :
10.1109/ICASID.2013.6825290