Title :
Low loss and high dielectric constant poly(methyl methacrylate)/BaTiO3 nanocomposites prepared by in situ atom transfer radical polymerization
Author :
Liyuan Xie ; Xingyi Huang ; Pingkai Jiang
Author_Institution :
Dept. of Polymer Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
Abstract :
Poly(methyl methacrylate) (PMMA) nanocomposites containing BaTiO3 were prepared by in situ atom transfer radical polymerization (ATRP). The nanocomposites show significantly increased dielectric constant when compared with the pure PMMA, whereas the dielectric loss of the nanocomposite is kept at the same low level as that of the pure PMMA. For example, at 1000 Hz, the dielectric constant increases from 6.9 for the nanocomposite containing 15 vol% BaTiO3 to 15 for the nanocomposite with 32 vol% BaTiO3, while the dielectric loss is almost independent on the BaTiO3 content and has a low value of 0.045. 1H NMR spectra confirmed the chemical structure of PMMA shell on the surface of BaTiO3 nanoparticles. Scanning electron microscopy (SEM) revealed that the BaTiO3 nanoparticles are well dispersed in the nanocomposites.
Keywords :
barium compounds; chemical exchanges; chemical structure; dielectric losses; filled polymers; free radical reactions; nanocomposites; nanofabrication; nanoparticles; particle reinforced composites; permittivity; polymerisation; proton magnetic resonance; scanning electron microscopy; 1H NMR spectra; ATRP; BaTiO3; PMMA shell chemical structure; SEM; dielectric constant; dielectric loss; frequency 1000 Hz; in situ atom transfer radical polymerization; nanocomposites; nanoparticles; poly(methyl methacrylate); scanning electron microscopy; Dielectric constant; Dielectric losses; Nanocomposites; Nanoparticles; Polymers; Scanning electron microscopy; Barium titanates (BaTiO3); Poly(methyl methacrylate)(PMMA); dielectric constant; dielectric loss; in situ atom transfer radical polymerization;
Conference_Titel :
Electrical Insulating Materials (ISEIM), Proceedings of 2011 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-4-88686-074-3
DOI :
10.1109/ISEIM.2011.6826329