DocumentCode :
686456
Title :
PD-induced surface degradation of insulation-embedded cavities: Microscopic investigation
Author :
Le Wang ; Cavallini, Andrea ; Montanari, Gian ; Vaughan, Alun ; Freebody, Nicola
Author_Institution :
DIE, Univ. of Bologna, Bologna, Italy
fYear :
2011
fDate :
6-10 Sept. 2011
Firstpage :
121
Lastpage :
124
Abstract :
With the aim of developing defect-based life models (i.e. life models in which breakdown is explicitly associated with a partial discharge-induced damage growth from a defect beyond a critical level), ageing tests were carried out in the lab on XLPE sandwich specimens containing artificial cavities. PD activity taking place in the cavities was continuously monitored during ageing. The behavior of discharge repetition rate and amplitude were extracted from the monitoring records. The modification of the cavity surface at various ageing times was investigated using microscope observation. Brownish solid byproducts, having oxygen containing moieties, were found covering uniformly the entire area of the cavity surface. After the byproduct was wiped off, degradation pits were observed. The variation of PD repetition rate and amplitude, as well as the relevant PD patterns, could be related to the modification of the cavity surface.
Keywords :
high-frequency transformers; insulating oils; partial discharge measurement; XLPE sandwich specimens; artificial cavities; brownish solid byproducts; cavity surface modification; cross-linked polyethylene; degradation pits; insulation-embedded cavities; microscopic investigation; oxygen containing moieties; partial discharge-induced surface degradation; Aging; Cavity resonators; Degradation; Dielectrics; Partial discharges; Scanning electron microscopy; Surface morphology; PD byproducts; Partial discharges; byproduct morphology; life models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulating Materials (ISEIM), Proceedings of 2011 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-4-88686-074-3
Type :
conf
DOI :
10.1109/ISEIM.2011.6826364
Filename :
6826364
Link To Document :
بازگشت