DocumentCode :
686592
Title :
Petiroc, a new front-end ASIC for time of flight application
Author :
Fleury, J. ; Callier, S. ; de La Taille, C. ; Seguin, N. ; Thienpont, D. ; Dulucq, F. ; Ahmad, Sahar ; Martin, G.
Author_Institution :
Weeroc SAS, Orsay, France
fYear :
2013
fDate :
Oct. 27 2013-Nov. 2 2013
Firstpage :
1
Lastpage :
5
Abstract :
Petiroc is a 16-channel front-end ASIC designed to readout silicon photomultipliers (SiPMs) for particle time-of-flight measurement applications. Petiroc combines a very fast and low-jitter trigger with an accurate charge measurement. The concept of the ASIC is to combine two measurement lines that won´t interfere one with another to measure both first incident photon timing measurement and whole crystal light charge integration. An adjustment of the SiPM high voltage is possible using a channel-by-channel input DAC. That allows a fine SiPM gain and dark noise adjustment at the system level to correct for the non-uniformity of SiPMs. The power consumption is 3.5 mW/channel, excluding ASIC outing buffer. First measurement on Petiroc shows a time jitter down to 16ps on 20 photoelectrons test pulses and 46ps with 15 photoelectrons from a Hamamatsu MPPC. Charge measurement has been measured and 1% linearity has been measured up to 2000 photoelectrons. Energy resolution has been measured at 9.5% FWMH. The main application of Petiroc is PET time-of-flight prototyping but can be used for any application that requires both sharp time resolution and precise energy measurement.
Keywords :
application specific integrated circuits; charge measurement; elemental semiconductors; integrated circuit noise; low-power electronics; photomultipliers; silicon; timing jitter; 16-channel front-end ASIC; Hamamatsu MPPC; Petiroc; Si; SiPM gain; channel-by-channel input DAC; charge measurement; dark noise adjustment; energy resolution; incident photon timing measurement; low-jitter trigger; particle time-of-flight measurement applications; photoelectrons; power consumption; silicon photomultipliers; whole crystal light charge integration; Application specific integrated circuits; Charge measurement; Energy measurement; Energy resolution; Jitter; Linearity; Noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
Type :
conf
DOI :
10.1109/NSSMIC.2013.6829018
Filename :
6829018
Link To Document :
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