• DocumentCode
    686592
  • Title

    Petiroc, a new front-end ASIC for time of flight application

  • Author

    Fleury, J. ; Callier, S. ; de La Taille, C. ; Seguin, N. ; Thienpont, D. ; Dulucq, F. ; Ahmad, Sahar ; Martin, G.

  • Author_Institution
    Weeroc SAS, Orsay, France
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Petiroc is a 16-channel front-end ASIC designed to readout silicon photomultipliers (SiPMs) for particle time-of-flight measurement applications. Petiroc combines a very fast and low-jitter trigger with an accurate charge measurement. The concept of the ASIC is to combine two measurement lines that won´t interfere one with another to measure both first incident photon timing measurement and whole crystal light charge integration. An adjustment of the SiPM high voltage is possible using a channel-by-channel input DAC. That allows a fine SiPM gain and dark noise adjustment at the system level to correct for the non-uniformity of SiPMs. The power consumption is 3.5 mW/channel, excluding ASIC outing buffer. First measurement on Petiroc shows a time jitter down to 16ps on 20 photoelectrons test pulses and 46ps with 15 photoelectrons from a Hamamatsu MPPC. Charge measurement has been measured and 1% linearity has been measured up to 2000 photoelectrons. Energy resolution has been measured at 9.5% FWMH. The main application of Petiroc is PET time-of-flight prototyping but can be used for any application that requires both sharp time resolution and precise energy measurement.
  • Keywords
    application specific integrated circuits; charge measurement; elemental semiconductors; integrated circuit noise; low-power electronics; photomultipliers; silicon; timing jitter; 16-channel front-end ASIC; Hamamatsu MPPC; Petiroc; Si; SiPM gain; channel-by-channel input DAC; charge measurement; dark noise adjustment; energy resolution; incident photon timing measurement; low-jitter trigger; particle time-of-flight measurement applications; photoelectrons; power consumption; silicon photomultipliers; whole crystal light charge integration; Application specific integrated circuits; Charge measurement; Energy measurement; Energy resolution; Jitter; Linearity; Noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829018
  • Filename
    6829018