Optical simulation of a DOI detector with a stack of planer scintillators

A novel DOI detector with a stack of planer scintillators (SOPS) allows easier position estimation and simpler fabrication. To investigate suitable optical characteristics of the proposed detector, we constructed a Monte Carlo simulator. In this paper, we studied the relationship between the surface roughness of monolithic scintillator and the spatial resolution. We defined the parameter of scintillator´s surface roughness as roughness rate which was used to statistically determine triangle patch´s angle in the simulator. We simulated a six layer SOPS and found that smoother surface leads to higher spatial resolution for x and y direction. Furthermore we applied laser-processed boundaries to the SOPS (SOPS with LPB). We confirmed that SOPS with LPB provided better spatial resolution although it leads to additional process in fabrication to some extent.