• DocumentCode
    686694
  • Title

    Simulated dental cone beam computed tomography using Timepix

  • Author

    Baek, S.H. ; Uher, Jason

  • Author_Institution
    Guidance Dental, Buena Park, CA, USA
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Novel photon counting detectors such as Timepix could allow novel applications within the dental practice. The feasibility of Timepix detector use for dental cone beam computed tomography (CBCT) was studied. The Timepix is a photon counting detector with pixel pitch of 55 μm. It provides better signal-to-noise properties and spatial resolution compared to standard imaging detectors used in dental applications. Due to the intrinsic properties of conventional detectors used for current CBCT, the clinical dental application is limited to macroscopic observation of 3D structure of anatomy or pathology. The advantages of Timepix could be utilized for clinical dental applications such as localization and demarcation of dental caries and dental calculi, demarcation of the tooth root form from surrounding alveolus bone, replacement of conventional dental impression techniques for varies uses.
  • Keywords
    bone; computerised tomography; dentistry; image resolution; medical image processing; photon counting; 3D structure; Timepix detector; alveolus bone; anatomy; clinical dental application; conventional dental impression techniques; conventional detectors; dental calculi; dental caries demarcation; dental caries localization; dental practice; macroscopic observation; novel photon counting detectors; pathology; pixel pitch; signal-to-noise properties; simulated dental cone beam computed tomography; spatial resolution; standard imaging detectors; tooth root form; Computed tomography; Dentistry; Detectors; Image reconstruction; Photonics; Teeth; Three-dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829123
  • Filename
    6829123