• DocumentCode
    686734
  • Title

    A software tool for on field spectrometry of diagnostic X-ray beams

  • Author

    Andreani, L. ; Bontempi, Marco ; Rossi, Pier Luca ; Rignanese, Luigi Pio ; Zuffa, M. ; Baldazzi, G.

  • Author_Institution
    Dept. of Phys. & Astron., Univ. of Bologna, Bologna, Italy
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Conventional radiology uses X-ray beams with polychromatic spectrum consisting of a bremsstrahlung continuous component - with an energy band known only by means of half value layer (HVL), filtration and kVp values - and fluorescence lines. However the knowledge of the spectrum is crucial to allow advanced improvements of the diagnostic imaging with the lowest dose administered to the patients. In order to overcome the difficulty to make direct spectrometry on the diagnostic beam, we developed a simulation software based on a parametric semi-empirical model, that is able to reconstruct the X-ray diagnostic spectrum from 10 keV to 140 keV. This software makes use of experimental parameters, which can be measured in real time by two different methods. In this paper the calibration of detection systems will be described and discussed. In addition, the experimental validation of the software will be illustrated.
  • Keywords
    X-ray spectra; bremsstrahlung; calibration; dosimetry; fluorescence; image reconstruction; medical image processing; radiology; software tools; X-ray diagnostic spectrum; bremsstrahlung continuous component; calibration; conventional radiology; diagnostic X-ray beams; diagnostic imaging; electron volt energy 10 keV to 140 keV; energy band; field spectrometry; fluorescence lines; half value layer; parametric semiempirical model; polychromatic spectrum; software tool; Anodes; Calibration; Current measurement; Detectors; Electron tubes; Filtration; Physics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829163
  • Filename
    6829163