A line process approach to penalized maximum-likelihood reconstruction for 3D SPECT

Traditional SPECT imaging requires a trade-off between resolution and sensitivity. We show that it is possible to eliminate this trade-off and come close to achieving both goals simultaneously. Abstractly, small pinhole data is used to improve the resolution of co-registered large pinhole data which has higher sensitivity. Mathematically, the former is used to initialize a set of line processes that control the extent to which a truncated quadratic prior is applied to the latter. The idea builds on previous work by others on anatomic priors.