A line process approach to penalized maximum-likelihood reconstruction for 3D SPECT

Author

Arrowood, Lloyd ; Sanghyeb Lee ; Gregor, J.

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA

fYear

2013

fDate

Oct. 27 2013-Nov. 2 2013

Firstpage

1

Lastpage

4

Abstract

Traditional SPECT imaging requires a trade-off between resolution and sensitivity. We show that it is possible to eliminate this trade-off and come close to achieving both goals simultaneously. Abstractly, small pinhole data is used to improve the resolution of co-registered large pinhole data which has higher sensitivity. Mathematically, the former is used to initialize a set of line processes that control the extent to which a truncated quadratic prior is applied to the latter. The idea builds on previous work by others on anatomic priors.

Keywords

image reconstruction; image registration; image resolution; maximum likelihood estimation; medical image processing; single photon emission computed tomography; 3D SPECT; anatomic priors; coregistered large pinhole data; image resolution; line process approach; penalized maximum-likelihood reconstruction; sensitivity; single photon emission computed tomography; truncated quadratic prior; Biomedical imaging; Image reconstruction; Image resolution; Process control; Single photon emission computed tomography; Three-dimensional displays;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE

Conference_Location

Seoul

Print_ISBN

978-1-4799-0533-1

Type

conf

DOI

10.1109/NSSMIC.2013.6829243

Filename

6829243