Title :
Investigation of optimization-based reconstruction for intra-operative neurological imaging
Author :
Xiao Han ; Oishi, Shuji ; Satow, Tetsu ; Yokoyama, Haruki ; Yamada, Makoto ; Silver, Michael D. ; Yu-Bing Chang ; Sidky, Emil Y. ; Xiaochuan Pan
Author_Institution :
Dept. of Radiol., Univ. of Chicago, Chicago, IL, USA
fDate :
Oct. 27 2013-Nov. 2 2013
Abstract :
Intra-operative C-arm cone-beam CT (CBCT) provides significant technical and workflow benefits for neurological interventions. Current C-arm CBCT employs FDK-type algorithms for image reconstruction, which require densely sampled projection data. This imaging practice incurs a large amount of radiation dose and prolonged scanning time. Yet, the reconstruction is susceptible to artifacts caused by both geometry and physical factors such as noise. In this work, we investigated and evaluated the adaptation of optimization-based reconstruction to C-arm-CBCT-based neurological imaging from full-and half-view patient data. The adaptation mainly entailed accurate incorporation of C-arm geometry and appropriate selection of algorithm parameters. The results show that optimization-based algorithms can yield images of effectively suppressed noise and shading artifacts, from half of the amount of data acquired in current clinical applications.
Keywords :
computerised tomography; data acquisition; image denoising; image reconstruction; image sampling; medical image processing; neurophysiology; optimisation; C-arm geometry; C-arm-CBCT-based neurological imaging; FDK-type algorithms; clinical applications; data acquisition; densely sampled projection data; geometry factors; image reconstruction; intraoperative C-arm cone-beam CT; intraoperative neurological imaging; noise artifacts; optimization-based reconstruction; physical factors; prolonged scanning time; radiation dose; shading artifacts; Algorithm design and analysis; Computed tomography; Geometry; Image reconstruction; Noise; Silver;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
DOI :
10.1109/NSSMIC.2013.6829335