DocumentCode :
686907
Title :
Dose reduction achieved by dynamically collimating the redundant rays in fan-beam and cone-beam CT
Author :
Yan Xia ; Berger, Marcel ; Riess, C. ; Hornegger, Joachim ; Maier, Andreas
Author_Institution :
Pattern Recognition Lab., Friedrich-Alexander-Univ., Erlangen-Nuremberg, Germany
fYear :
2013
fDate :
Oct. 27 2013-Nov. 2 2013
Firstpage :
1
Lastpage :
4
Abstract :
In X-ray computed tomography (CT), short-scan acquisition that acquires data only over a range of π plus the fan angle, rather than a full range of 2π, is commonly used in circular fan-beam and cone-beam geometry. Such scan aims to reduce acquisition time and radiation dose during data acquisition. However, during a partial circle scan some data are measured once, while other measurements are observed twice. Traditionally, the redundant data are weighted by a smooth function (e.g. the Parker weights) before filtering. In this paper, we present an algorithmic setup that employs dynamic collimation to shield the redundant rays and propose two algorithms to correct the resulting truncation. This approach is able to potentially decrease the dose of 10% for a C-arm CT with fan angle of 10° and of 23% for a diagnostic CT with fan angle of 50°. Evaluation shows that the reconstruction results are of comparable accuracy to the one from standard short-scan FDK, with less dose to the patient.
Keywords :
collimators; computerised tomography; data acquisition; diagnostic radiography; image reconstruction; medical image processing; C-arm computed tomography; Parker weights; X-ray computed tomography; circular cone-beam CT; circular fan-beam CT; data acquisition; dynamical redundant ray collimation; image reconstruction; radiation dose reduction; short-scan FDK; Atmospheric measurements; Extrapolation; Geometry; Particle measurements; Phantoms; Data Redundancy; Dose Reduction; Short-scan; X-ray Computed Tomography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
Type :
conf
DOI :
10.1109/NSSMIC.2013.6829341
Filename :
6829341
Link To Document :
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