DocumentCode :
686916
Title :
Fast scatter correction for cone-beam computed tomography using the statistical method
Author :
Aootaphao, Sorapong ; Thongvigitmanee, S. ; Rajruangrabin, Jartuwat ; Yampri, Pinyo ; Srivongsa, Tanapong ; Thajchayapong, P.
Author_Institution :
X-Ray CT & Med. Imaging Lab., Nat. Electron. & Comput. Technol. Center, Pathumthani, Thailand
fYear :
2013
fDate :
Oct. 27 2013-Nov. 2 2013
Firstpage :
1
Lastpage :
3
Abstract :
X-ray scatter signals acquired from a large flat panel detector in cone-beam computed tomography (CBCT) can degrade image quality of cross-section images. In this paper, we propose a new fast scatter correction method in CBCT using the statistical method in combination with the downsampling technique in projection images to reduce the computation time. The downsampled primary signal is estimated using the MLEM algorithm and then upsampled to obtain the original size. To reduce the upsampling effect, we deconvolve one more time to obtain the final estimated primary signal. The experimental results show that the proposed method with downsampling by two can reduce the computation time by a factor of more than four. In addition, the quality of reconstructed images is improved in terms of higher CT number accuracy and smaller cupping artifacts in comparison with the results obtained from fan-beam computed tomography.
Keywords :
computerised tomography; expectation-maximisation algorithm; image reconstruction; image sampling; medical image processing; CBCT; MLEM algorithm; X-ray scatter signals; cone-beam computed tomography; cross-section images; downsampling technique; fan-beam computed tomography; fast scatter correction method; final estimated primary signal; image quality; image reconstruction quality; large flat panel detector; statistical method; Computed tomography; Detectors; Image quality; Image reconstruction; Kernel; Statistical analysis; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
Type :
conf
DOI :
10.1109/NSSMIC.2013.6829350
Filename :
6829350
Link To Document :
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