• DocumentCode
    686943
  • Title

    Material decomposition using a singular value decomposition method

  • Author

    Maji, Takeshi ; Matsumoto, Morio ; Kaibuki, Futoshi ; Ogawa, Koichi

  • Author_Institution
    Grad. Sch. of Eng., Hosei Univ., Tokyo, Japan
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The development of photon counting detectors enables us to decompose materials in x-ray CT images. The photon counting detection can measure a linear attenuation coefficient of a given energy range, thereby contributing to the material decomposition or identification. In this detection, measured photon counts were affected by statistical noise, making it difficult to obtain accurate measurements of material concentration. To calculate this concentration ratio the principal component analysis is sometimes used, although the results are much affected by the noise included in the measured data. In this paper we evaluate the performance of the singular value decomposition (SVD) method for the purpose of material decomposition using the numerical simulation phantom and Monte Carlo simulation. The materials used were water, calcium, Au-colloid, and gadolinium solution. The results of simulations showed that the accuracy strongly depended on the setting of energy windows and the energy resolution of the detector.
  • Keywords
    Monte Carlo methods; X-ray imaging; computerised tomography; light absorption; noise; photon counting; principal component analysis; singular value decomposition; statistical analysis; Au-colloid solution; Monte simulation; SVD; X-ray CT images; calcium solution; energy windows; gadolinium solution; linear attenuation coefficient; material decomposition; material identification; numerical simulation phantom; photon counting detection; photon counting detectors; principal component analysis; singular value decomposition method; statistical noise; water; Accuracy; Detectors; Energy resolution; Materials; Matrix decomposition; Photonics; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829379
  • Filename
    6829379