• DocumentCode
    686988
  • Title

    Performance of irradiated thin edgeless N-on-P planar pixel sensors for ATLAS upgrades

  • Author

    Bomben, Marco ; Bagolini, Alvise ; Boscardin, Maurizio ; Bosisio, Luciano ; Calderini, Giovanni ; Chauveau, J. ; Giacomini, G. ; La Rosa, Alessandro ; Marchiori, Giacomo ; Zorzi, Nicola

  • Author_Institution
    Lab. de Phys. Nucl. et de Hautes Energies (LPNHE), Paris, France
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In view of the LHC upgrade phases towards the High Luminosity LHC (HL-LHC), the ATLAS experiment plans to upgrade the Inner Detector with an all-silicon system. Because of its radiation hardness and cost effectiveness, the n-on-p silicon technology is a promising candidate for a large area pixel detector. The paper reports on the joint development, by LPNHE and FBK of novel n-on-p edgeless planar pixel sensors, making use of the active trench concept for the reduction of the dead area at the periphery of the device. After discussing the sensor technology, a complete overview of the electrical characterization of several irradiated samples will be discussed. Some comments about detector modules being assembled will be made and eventually some plans will be outlined.
  • Keywords
    radiation hardening (electronics); silicon radiation detectors; ATLAS upgrades; CERN Large Hadron Collider; FBK; High Luminosity LHC; LHC upgrade phases; LPNHE; electrical characterization; irradiated thin edgeless; n-on-p planar pixel sensors; sensor technology; Current measurement; Detectors; Frequency measurement; Radiation effects; Sensor phenomena and characterization; Voltage measurement; Solid state detectors; radiation hard sensors; silicon tracking detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829425
  • Filename
    6829425