DocumentCode
686989
Title
Evaluation of irradiated barrel detector modules for the upgrade of the CMS pixel detector
Author
Sibille, Jennifer
Author_Institution
Inst. fur Experimentalphys., Hamburg, Germany
fYear
2013
fDate
Oct. 27 2013-Nov. 2 2013
Firstpage
1
Lastpage
4
Abstract
The instantaneous luminosity of the Large Hadron Collider (LHC) is being increased in several steps over the next 10 years to maximize its discovery potential for new physics. However, at a luminosity of twice the design luminosity of the LHC of 1×1034 cm-2s-1, the performance of the current CMS pixel detector is degraded by substantial deadtime incurred by the readout chip (ROC). To make full use of the proton-proton collisions being provided by the LHC, CMS will replace its pixel detector in 2016/17 by a new four-layer detector. The new readout chip used in the barrel detector will have increased buffering capabilities to minimize deadtime, and digital readout protocol to increase the readout speed. CMS recently received a prototype version of the new digital ROC. Prototype detector modules comprising sensors and the new readout chips were assembled and irradiated with protons at the CERN PS, and readout chips without sensors have been irradiated with protons at the Karlsruhe Zyklotron to test their performance under LHC conditions. The modules are being evaluated in an electron test beam at DESY, and the ROCs are evaluated in lab measurements. Key chip parameters and results of the absolute energy calibration are compared as a function of particle fluence.
Keywords
nuclear electronics; readout electronics; semiconductor counters; CMS pixel detector; LHC instantaneous luminosity; Large Hadron Collider; digital readout protocol; electron test beam; irradiated barrel detector modules; proton-proton collisions; readout chip; readout chips; Calibration; Detectors; Large Hadron Collider; Semiconductor device measurement; Spatial resolution; Telescopes;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location
Seoul
Print_ISBN
978-1-4799-0533-1
Type
conf
DOI
10.1109/NSSMIC.2013.6829426
Filename
6829426
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