• DocumentCode
    686990
  • Title

    A silicon based cosmic ray telescope as an external tracker to measure detector performance

  • Author

    Bettarini, S. ; Bosi, F. ; Cavallaro, E. ; Dussoni, S. ; Galli, L. ; Morsani, Fabio ; Minuti, M. ; Nicolo, D. ; Walsh, J.

  • Author_Institution
    Univ. di Pisa, Pisa, Italy
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    High energy physics experiments in the intensity frontier push at the limit the detector resolutions. This is the also case for the upgrade of the MEG experiment that requires a design of a new drift chamber to track 52.8 MeV positrons with a single hit resolution of about 100 μm. In order to to compare the tracking performances of various prototypes implementing different cell configurations, a high resolution cosmic ray telescope is required. We built our telescope by assembling four spare ladderts of the external layers of the Silicon Vertex Detectors of the Babar experiment. This test facility operating at INFN sezione di Pisa provides the detector under test with an external track with a resolution of 15 μm on the DUT plane. The DAQ originally used in the Babar experiment had to be replaced by a custom design boards coupled with an acquisition front-end PC through commercial FPGA evaluation boards.
  • Keywords
    cosmic ray apparatus; drift chambers; field programmable gate arrays; particle tracks; silicon radiation detectors; Babar experiment; DAQ; DUT plane; FPGA evaluation boards; INFN sezione di Pisa; MEG experiment upgrade; acquisition front-end PC; cell configurations; detector performance measurement; detector resolutions; drift chamber; external track resolution; high energy physics experiments; silicon based cosmic ray telescope; silicon vertex detector external layers; Data acquisition; Detectors; Field programmable gate arrays; Noise; Silicon; Strips; Telescopes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829427
  • Filename
    6829427