• DocumentCode
    687025
  • Title

    Test beam study of a short drift GEM tracking detector

  • Author

    Purschke, M.L. ; Azmoun, B. ; Pak, R. ; Cao, Tian ; Woody, C.

  • Author_Institution
    Brookhaven Nat. Lab., Upton, NY, USA
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A short drift GEM tracking detector was studied in the H6 test beam at CERN as part of an effort to develop new tracking detectors for future experiments at RHIC. The detector consists of a triple GEM stack with a 16 mm drift gap and a COMPASS style readout plane with XY readout strips that is used in a mini TPC type configuration. Charge produced by tracks passing through the drift gap is collected over ~ 700 ns and sampled at a rate of 25 ns which allows a measurement of the drift time of the charge clusters from the initial ionization. This enables a determination of the angle of the track passing through the detector as well as its position. The resulting vector can be used to improve the position resolution compared to simple charge centroid determination for tracks passing through the detector at large angles, and can also reduce the number of detectors required to measure tracks with a given precision. We have studied some basic characteristics of the short drift GEM detector in the lab using a beta source and cosmic rays, and have also studied it more extensively in a test beam at CERN. This paper will report on the results of these studies.
  • Keywords
    electron microscopy; readout electronics; scintillation counters; time projection chambers; CERN; COMPASS style readout plane; XY readout strips; beta source; charge clusters; cosmic rays; initial ionization; mini TPC type configuration; short drift GEM tracking detector; test beam study; Charge measurement; Detectors; Position measurement; Strips; Telescopes; Time measurement; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829463
  • Filename
    6829463