• DocumentCode
    687030
  • Title

    Comparison of various plastic scintillators with pulse shape discrimination (PSD) capabilities based on polystyrene (PS)

  • Author

    Iwanowska-Hanke, J. ; Moszynski, M. ; Swiderski, L. ; Sibczynski, P. ; Krakowski, Tracey ; Zaitseva, N. ; Pawelczak, I.A. ; Martinez, P. ; Gektin, A. ; Zhmurin, P.N.

  • Author_Institution
    Nat. Centre for Nucl. Res., Otwock-Swierk, Poland
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The work presents the performance of different plastics with PSD capabilities, based on PS, developed by Lawrence Livermore National Laboratory (LLNL) and Institute for Scintillating Materials of National Academy of Sciences of Ukraine (ISMA). The scintillation performances and n/γ discrimination properties were compared with the performance of a sample of stilbene. The tested samples are characterized by quite high photoelectron yield (3800 phe/MeV for LLNL plastic and 3100 phe/MeV for ISMA plastic), slightly lower than stilbene (4200 phe/MeV). The values of figure of merit (FOM) as a function of narrow energy cuts, showed that LLNL plastic has slightly better PSD performance than ISMA one; however stilbene has still significantly better performance than both tested samples.
  • Keywords
    gamma-ray detection; neutron detection; solid scintillation detectors; ISMA plastic; Institute for Scintillating Materials of National Academy of Sciences of Ukraine; LLNL plastic; Lawrence Livermore National Laboratory; figure of merit; gamma discrimination properties; high photoelectron yield; neutron discrimination properties; plastic scintillators; polystyrene; pulse shape discrimination capabilities; pulse shape discrimination performance; scintillation performances; stilbene; Crystals; Gamma-rays; Laboratories; Neutrons; Photonics; Plastics; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829468
  • Filename
    6829468