Title :
Development of new ion beam monitor system using conductive mesh
Author :
Ito, Satoshi ; Matsuzaki, Hideaki ; Yasumoto, Masayoshi ; Morita, Akio
Author_Institution :
Sch. of Eng., Univ. of Tokyo, Tokyo, Japan
fDate :
Oct. 27 2013-Nov. 2 2013
Abstract :
A new beam monitor system wherein beam current and a beam shape can be monitored simultaneously was developed. This was accomplished by attaching conductive copper mesh on the fluorescent glass. The copper mesh not only provided the electric conductivity but also had effect to suppress secondary electron.
Keywords :
electrical conductivity; ion beams; particle beam diagnostics; beam current; beam shape; conductive copper mesh; electric conductivity; fluorescent glass; ion beam monitor system; secondary electron suppression; Current measurement; Fluorescence; Glass; Ion beams; Monitoring; Shape; Voltage measurement;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
DOI :
10.1109/NSSMIC.2013.6829491
