DocumentCode
687227
Title
Fabrication of Silicon-Photomultiplier multi arrays and the performance test
Author
Hye Young Lee ; Jeon, J.A. ; Seul Ki Yang ; Jik Lee ; Park, Il H.
Author_Institution
Sungkyunkwan Univ., Suwon, South Korea
fYear
2013
fDate
Oct. 27 2013-Nov. 2 2013
Firstpage
1
Lastpage
2
Abstract
SiPM (Silicon Photomultiplier) is a semiconductor light diode comprised of many micropixels. Due to its positive characteristics, SiPM is considered as the next generation model of silicon photo amplifier. A photo-sensor made by multi arrays of SiPM sensors can even takes an image at the environment of old(dark) moon. Array of SiPMs with a minimum gap between the sensors is needed for some applications where a fine imaging of sources with low intensity radiations is required. We have attempted to fabricate SiPM sensors in various forms of arrays from the lithographic process in order to apply them in imaging astrophysical objects with low intensity. In the first process of the fabrication, we have produced various sizes of single SiPM sensors and also the arrays. The design includes unit sensors in the size of 0.5mm × 0.5mm, consisting of 103 micropixles with the maximum geometric efficiency of 70%. One of the arrays produced is 8 × 8 matrix of the unit sensors with the sensors gap of 60 um. We have tested the sensor arrays for the electrical characteristics and the dark rates. Details in the sensor and array design, the fabrication procedure, and the results of the performance test with the output from the first production are presented.
Keywords
amplifiers; elemental semiconductors; lithography; optical fabrication; photodetectors; photomultipliers; sensor arrays; silicon; Si; SiPM sensors; astrophysical object imaging; dark rates; electrical characteristics; lithographic process; next generation model; photosensor fabrication; semiconductor light diode; silicon photoamplifier; silicon photomultiplier multiarray fabrication; size 0.5 mm; Fabrication; Image sensors; Photonics; Sensor arrays; Sensor phenomena and characterization; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location
Seoul
Print_ISBN
978-1-4799-0533-1
Type
conf
DOI
10.1109/NSSMIC.2013.6829673
Filename
6829673
Link To Document