DocumentCode :
687312
Title :
Dual Stage Time-over-Threshold processing chain for silicon detectors with large capacitance
Author :
Kasinski, Krzysztof ; Kleczek, R. ; Grybos, Pawel ; Szczygiel, Robert
Author_Institution :
Dept. of Meas. & Electron., AGH Univ. of Sci. & Technol., Cracow, Poland
fYear :
2013
fDate :
Oct. 27 2013-Nov. 2 2013
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents the architecture, simulation and measurement results of a low power dual stage charge sensitive amplifier providing a time-over-threshold analog to digital conversion with linear transfer characteristic dedicated for readout of long silicon strip detectors. The key features of the presented solution are: very low power consumption (2 mW), linear transfer characteristic and low charge losses at high detector capacitance. This work was motivated by the requirements of a new Silicon Tracking System at the Compressed Baryonic Matter experiment at FAIR centre. The issues investigated using other prototype ASICs implementing a constant-current discharge feedback and working with high detector capacitances (tens of pF) directed us to develop the presented idea and to evaluate it with a prototype ASIC. Up to our knowledge, due to the difficult operating conditions this solution fills the gap within the existing fabricated circuits.
Keywords :
analogue-digital conversion; application specific integrated circuits; nuclear electronics; silicon radiation detectors; FAIR centre; compressed baryonic matter experiment; constant-current discharge feedback; high-detector capacitances; linear transfer characteristic; low-power dual stage charge sensitive amplifier; prototype ASIC; silicon detectors; silicon strip detectors; silicon tracking system; time-over-threshold analog-to-digital conversion; time-over-threshold processing chain; Application specific integrated circuits; Capacitance; Detectors; Noise; Prototypes; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
Type :
conf
DOI :
10.1109/NSSMIC.2013.6829762
Filename :
6829762
Link To Document :
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