Title :
Fast readout ASIC for si-strip detector in the J-PARC muon g-2/EDM experiment and other related applications
Author :
Ueno, K. ; Ikeda, Hinata ; Ikeno, M. ; Kohriki, T. ; Mibe, T. ; Nishimura, S. ; Uchida, Tomoyuki ; Sasaki, O. ; Saito, Nobuo ; Tanaka, Mitsuru
Author_Institution :
Inst. of Particle & Nucl. Studies, KEK, Tsukuba, Japan
fDate :
Oct. 27 2013-Nov. 2 2013
Abstract :
A new measurement of the anomalous magnetic moment (g-2) and electric dipole moment (EDM) of the positive muon at J-PARC is proposed, which measures the g-2 with the precision of 0.1 ppm and the EDM with sensitivity down to the order of 10-21 e·cm. We proposed to use a highly-segmented positron tracker in this experiment. From the simulation study, we chose a radial vane silicon strip detector as the tracker and have promoted the R&D. Then, the development of readout frontend ASIC is indispensible to achieve the detector goal performance. The ASIC requires good tracking efficiency due to the high hit rate of 1.6 MHz per strip, deep memory due to 5 muon life time (~40 μs) measurement, and high integration due to the large number of channels to the small space. We have developed the prototype ASIC with UMC 0.25μm CMOS technologies and evaluated that. In this paper, we report the design of the fast readout ASIC for the silicon-strip detector in the J-PARC muon g-2/EDM experiment and the performance of the prototype ASIC.
Keywords :
application specific integrated circuits; lepton electric moment; lepton magnetic moment; muon detection; particle tracks; readout electronics; silicon radiation detectors; CMOS technologies; EDM experiment; J-PARC muon g-2 experiment; anomalous magnetic moment; electric dipole moment; fast readout ASIC; frequency 1.6 MHz; highly-segmented positron tracker; radial vane silicon strip detector; readout frontend ASIC; tracking efficiency; Application specific integrated circuits; Blades; Detectors; Mesons; Positrons; Silicon; Strips;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
DOI :
10.1109/NSSMIC.2013.6829771